Polar Oxide Interface Characterization by Differential Phase Contrast STEM
نویسندگان
چکیده
منابع مشابه
Polar Oxide Interface Characterization by Differential Phase Contrast STEM
Understanding the atomic-scale structure of surfaces and interfaces is essential to control the functional properties of many materials and devices. Recent advances in aberration-corrected scanning transmission electron microscopy (STEM) have made possible the direct characterization of localized atomic structure in ceramic materials, especially grain boundaries and heterointerfaces. In STEM, a...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614006898